Characterization and Analysis HR-SEM (Hitachi S-4700) Tool details → Atomic Force Microscope (DI-3000) Tool details → Atomic Force Microscope (Asylum Research/Oxford Instruments MFP-3D Infinity) Tool details → Surface Profiler (KLA Tencor P-6) Tool details → Film thickness measurement (Nanometrics AFT 2100 Nanospec) Tool details → Ellipsometer (Rudolph AutoEL II) Tool details → Ellipsometer Multi-layer measurements wave length 193-2500nm (Woollam VASE) Tool details → Ellipsometer (Woollam M-2000UI) Tool details → Film stress measurement (Tencor FLX-2320) Tool details → C-V Plotter (MDC) Tool details → FPP-5000 Automatic Resistivity Meter Tool details → CDs Optical Measurements (Vickers micro-system) Tool details → Optical Microscope with a camera (Nikon Eclipse L200) Tool details → Optical Microscope (Nikon Labophot-2) Tool details → Optical Microscopes with a camera (Olympus BX-60) Tool details → Optical Microscope (Zeiss Axiotron) Tool details → Contact Angle Goniometer (Ramé-hart 200) Tool details → Clara4 SEM Tool details → Raman WITec (alpha300) Tool details → Need help choosing the right tool? Contact us. Contact Us
