C-V Plotter (MDC)

Vendor: MDC

Contact: Yacov Shneider (04-829-4205, shneider@ee.technion.ac.il)

The MDC C-V plotter is a current-voltage measurement system used to analyze the properties of high quality semiconductor and oxide materials.

The MDC system integrates two types of probe stations:

  • a QuietCHUCK Hot Chuck System for mobile ion measurements by conventional bias temperature stress technique (CVBT);
  • a Mercury Probe for temporary, non-destructive contact to MOS and bare semiconductor samples at room temperature.


Different operation modes:

  • Capacitance-Voltage measurement
  • MOS C-V measurement and analysis
  • MOS doping profile analysis
  • MOS Capacitance -Time measurement and analysis