Ellipsometer (Woollam M-2000UI)

Vendor: J. A. Woollam, Model: M-2000UI

Contact: Guy Ankonina (04-829-5014, anguy@technion.ac.il)

The M-2000UI Ellipsometer is used for measuring the optical properties of different materials such as metals semiconductors dielectrics and polymers with fast and accurate capability.


  • Spectroscopic scans at different angles from 40° to 90°
  • Wide spectral range: 246-1690nm (660 wavelengths)
  • Isotropic measurements
  • Reflectance mode
  • WVASE32 software