Vendor: J. A. Woollam, Model: M-2000UI
Contact: Guy Ankonina (04-829-5014, email@example.com)
The M-2000UI Ellipsometer is used for measuring the optical properties of different materials such as metals semiconductors dielectrics and polymers with fast and accurate capability.
- Spectroscopic scans at different angles from 40° to 90°
- Wide spectral range: 246-1690nm (660 wavelengths)
- Isotropic measurements
- Reflectance mode
- WVASE32 software