Vendor: J. A. Woollam, Model: VASE
Contact: Guy Ankonina (04-829-5014, anguy@technion.ac.il)
The VASE (variable angle spectroscopic ellipsometry) Ellipsometer is used for measuring the optical properties of different materials such as metals semiconductors dielectrics and polymers with high accuracy.
Specifications:
- Spectroscopic scans at different angles from 15° to 90° with resolution of 0.02°
- Wide spectral range: 240-2500nm with resolution of 2Å
- Isotropic and anisotropic measurements
- Reflectance and transmittance measurements
- XY mapping
- Heating Stage (up to 300°C)
- WVASE32 software