Vendor: WITec, Model: alpha300 Contact: Assael Cohen (077-8775028, assaelc@technion.ac.il ) A confocal Raman imaging solution that excels in speed, sensitivity, and resolution. Creating hyperspectral images Read More
Category: Characterization
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Vendor: Tescan, Model: CLARA4 LMH UHR SEM Clara4 is BrightBeam™ field-free UHR analytical FE-SEM with Schottky electron source, energy and angular selective in-column Read More -
Vendor: Ramé-hart, Model: Ramé-hart 200 Contact: Guy Ankonina (04-829-5014, anguy@technion.ac.il) The Model 200 is a robust contact angle tool using Read More -
Vendor: Zeiss, Model: Axiotron Contact: Yacov Shneider (04-829-4205, shneider@ee.technion.ac.il) Zeiss Axiotron optical microscope is suitable for high quality inspection of Read More -
Vendor: Olympus, Model: BX-60 Contact: Dima Peselev (04-8295125, pesel@ee.technion.ac.il) Two Olympus BX-60 optical microscopes are located in the silicon room Read More -
Vendor: Nikon, Model: Labophot-2 Contact: Yacov Shneider (04-829-4205, shneider@ee.technion.ac.il) Nikon optical microscope is suitable for high quality inspection of small Read More -
Vendor: Nicon, Model: Eclipse L200 Contact: Dima Peselev (04-8295125, pesel@ee.technion.ac.il) The Nicon Eclipse L200 optical microscope is used for precise Read More -
Vendor: Vickers micro-system, Model: M41 Contact: Tatiana Beker (04-829-3250, tatiana@ee.technion.ac.il) Dr. Orna Ternyak (04-829-4204, ornater@technion.ac.il) The Vickers M41 microscope is Read More -
Vendor: Veeco, Model: FPP-5000 Contact: Yacov Shneider (04-8294205, shneider@ee.technion.ac.il) Measurement of resistive properties of a semiconductor wafer and resistive films. Read More -
Vendor: MDC Contact: Yacov Shneider (04-829-4205, shneider@ee.technion.ac.il) The MDC C-V plotter is a current-voltage measurement system used to analyze the Read More -
Vendor: Tencor, Model: FLX-2320 Contact: Dr. Orna Ternyak (04-829-4204, ornater@technion.ac.il) Flexus (Tencor FLX-2320) is a non-contact thin-film stress measurement instrument Read More -
Vendor: J. A. Woollam, Model: M-2000UI Contact: Guy Ankonina (04-829-5014, anguy@technion.ac.il) The M-2000UI Ellipsometer is used for measuring the optical Read More -
Vendor: J. A. Woollam, Model: VASE Contact: Guy Ankonina (04-829-5014, anguy@technion.ac.il) The VASE (variable angle spectroscopic ellipsometry) Ellipsometer is used Read More -
Vendor: Rudolph Technologies, Inc., Model: Rudolph AutoEL II Contact: Valentina Korchnoy (04-829-3894, vkorchno@ef.technion.ac.il) RUDOLPH AutoEL II is a single wavelength, Read More -
Vendor: Nanometrics, Model: AFT 2100 Nanospec Contact: Tatiana Beker (04-829-3250, tatiana@ee.technion.ac.il) Dr. Orna Ternyak (04-829-4204, ornater@technion.ac.il) The AFT 2100 Nanospec Read More -
Vendor: KLA Tencor, Model: P-6 Contact: Dr. Orna Ternyak (04-829-4204, ornater@technion.ac.il) The KLA-Tencor P-6 is a mechanical highly sensitive surface Read More -
Vendor: Asylum, Model: MFP-3D Infinity AFM Contact: Cecile Saguy (04-829-3547, cecile@si.technion.ac.il) The MFP-3D Infinity is an AFM system that supports Read More -
Vendor: Digital Instruments, Model: DI-3000 Contact: Yacov Shneider (04-829-4205, shneider@ee.technion.ac.il), Assaf Yarden ( 052-5987181, assaf.yarden@gmail.com) Atomic Force Microscope DI-3000 provides Read More -
Vendor: Hitachi, Model: S-4700 Contact: Valentina Korchnoy (04-829-3894, vkorchno@ef.technion.ac.il) The Hitachi S-4700 is a field emission scanning electron microscope (FE-SEM), Read More