Vendor: Bruce Technologies Inc., Model: BDF-4 RTRI-878 & BDF-4 RTRI-880
Contact: Eran Lipp (04-829-4205, lipp@technion.ac.il)
Bruce Technologies Inc. BDF-4 RTRI-878, 4-stack furnace system, with 4 horizontal tubes (3- LPCVD, 1- atmospheric), prepared for processing of up to 4” size silicon wafers.
Bruce Technologies Inc. BDF-4 RTRI-880, 4-stack furnace system, with 4 horizontal atmospheric tubes, prepared for processing of up to 4” size silicon wafers.
Quartz reactor tubes, Quartz Boats, three temperature zones manual loading set up.
Samples are restricted to silicon-based materials only
Atmospheric furnaces:
- Dry oxidation – N2 ambient, 700-1100C, O2
- Hydrogen anneal – N2 ambient, 400-600C, H2, N2
- Anneal – N2, O2 ambient, 600-1100C, O2, N2
Oxidation process parameters:
Temperature | 600-1100°C |
Thickness | 80-10,000Å |
Wafer load | 100 |
Refractive index | 1.45 ± 0.05 |
Thin oxide | 75Å |
WW, WTW, RTR | ± 2 % |
Low-Pressure CVD furnace:
- Silicon Nitride – N2 ambient, 700-810C, NH3, SiH2Cl2, 100-300mTorr
Nitride process parameters:
Wafer load | 100 |
Deposition rate | 70-90 Å/min |
Thickness | 3,500-5,000 Å |
Refractive index | 2.0 ± 0.05 |
WW, WTW, RTR | ± 3.5 % |