Vendor: Digital Instruments, Model: DI-3000
Contact: Yacov Shneider (04-829-4205, firstname.lastname@example.org),
Assaf Yarden ( 052-5987181, email@example.com)
Atomic Force Microscope DI-3000 provides an ability to image and analyze surface topography of conducting and dielectric films as well as adsorbed molecules and nanoparticles by a variety of high resolution surface imaging techniques. All techniques share a common approach where a motor controlling a mechanical tip is placed in a feedback loop as the tip is scanning across a surface. The mechanism upon which the feedback is based is the predominant difference between the modes. Contact mode AFM operates by scanning a tip attached to the end of a cantilever across the sample surface while monitoring the change in cantilever deflection with a split photodiode detector. Tapping mode AFM operates by scanning a tip attached to the end of an oscillating cantilever across the sample surface. The feedback loop maintains constant oscillation amplitude by maintaining a constant RMS of the oscillation signal acquired by the split photodiode detector.
The system has a vibration isolation enclosure, to get a vertical noise resolution of sub-nanometer level.
- Sample size is from small pieces up to 6″ wafers, maximum 10mm thick
- Resolution: 2-10nm in (X-Y) (tip dependent) and sub-nm in (Z)
- Maximum scanning area is 50×50 µm²
- Main operation modes: Contact and Tapping modes in air and in fluids
- Other modules are available:
- scanning capacitance microscopy (C-V characteristics)
- current AF microscopy (C-AFM) (local I-V characteristics)
- tunneling-AFM (TUNA) with ultra-low current measurements